Dieter Hendrickx: search on Z-Library

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1

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 21 February 2010)] Extreme Ultraviolet (EUV) Lithography - Performance of the ASML EUV Alpha Demo Tool

Hermans, Jan V., Hendrickx, Eric, Laidler, David, Jehoul, Christiane, Van Den Heuvel, Dieter, Goethals, Anne-Marie, La Fontaine, Bruno M.

Year:

2010

Language:

english

File:

PDF, 3.65 MB

english, 2010

2

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Extreme Ultraviolet (EUV) Lithography IV - Track processing optimizations for different EUV resist platforms: preparing for a NXE:3300 baseline process

Foubert, Philippe, Naulleau, Patrick P., Matsunaga, Koichi, Shite, Hideo, Shimoaoki, Takeshi, Nafus, Kathleen, Goethals, Anne-Marie, Van Den Heuvel, Dieter, Hermans, Jan, Hendrickx, Eric, Kosugi, Hito

Year:

2013

Language:

english

File:

PDF, 3.05 MB

english, 2013

3

ELISA for the measurement of serum and urinary chorionic gonadotropin concentrations in the laboratory macaque

C. J. Munro, L. S. Laughlin, J. C. Illera, J. Dieter, A. G. Hendrickx, B. L. Lasley

Journal:

American Journal of Primatology

Year:

1997

Language:

english

File:

PDF, 125 KB

english, 1997

4

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California (Monday 13 September 2010)] Photomask Technology 2010 - Natural EUV mask blank defects: evidence, timely detection, analysis and outlook

Van den Heuvel, Dieter, Montgomery, M. Warren, Maurer, Wilhelm, Jonckheere, Rik, Magana, John, Abe, Tsukasa, Bret, Tristan, Hendrickx, Eric, Cheng, Shaunee, Ronse, Kurt

Year:

2010

Language:

english

File:

PDF, 2.66 MB

english, 2010

5

SPIE Proceedings [SPIE 27th European Mask and Lithography Conference - Dresden, Germany (Tuesday 18 January 2011)] 27th European Mask and Lithography Conference - Evidence of printing blank-related defects on EUV masks missed by blank inspection

Jonckheere, Rik, Behringer, Uwe F.W., Van den Heuvel, Dieter, Bret, Tristan, Hofmann, Thorsten, Magana, John, Aharonson, Israel, Meshulach, Doron, Hendrickx, Eric, Ronse, Kurt

Year:

2011

Language:

english

File:

PDF, 4.89 MB

english, 2011

6

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 24 February 2008)] Optical Microlithography XXI - Image contrast contributions to immersion lithography defect formation and process yield

Rathsack, Ben, Hooge, Josh, Scheer, Steven, Nafus, Kathleen, Hatakeyama, Shinichi, Kouichi, Hontake, Kitano, Junichi, Van Den Heuval, Dieter, Leray, Philippe, Hendrickx, Eric, Foubert, Phillipe, Gronh

Year:

2008

Language:

english

File:

PDF, 431 KB

english, 2008

7

Affirmatieve hulpverlening aan homoseksuele mannen.

Dieter Hendrickx, Germain Lietaer

Journal:

Tijdschrift voor Psychotherapie

Year:

2003

Language:

dutch

File:

PDF, 171 KB

dutch, 2003

8

SPIE Proceedings [SPIE Defense and Security Symposium - Orlando (Kissimmee), FL (Monday 17 April 2006)] Targets and Backgrounds XII: Characterization and Representation - Mapping energy balance fluxes and root zone soil moisture in the White Volta Basin using optical imagery

Hendrickx, Jan M. H., Hong, Sung-ho, Friesen, Jan, Compaore, Halidou, van de Giesen, Nick C., Rodgers, Charles, Vlek, Paul L. G., Watkins, Wendell R., Clement, Dieter

Year:

2006

Language:

english

File:

PDF, 1.16 MB

english, 2006

9

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California (Monday 19 September 2011)] Photomask Technology 2011 - Additional evidence of EUV blank defects first seen by wafer printing

Jonckheere, Rik, Maurer, Wilhelm, Abboud, Frank E., Van den Heuvel, Dieter, Bret, Tristan, Hofmann, Thorsten, Magana, John, Aharonson, Israel, Meshulach, Doron, Hendrickx, Eric, Ronse, Kurt

Year:

2011

Language:

english

File:

PDF, 3.44 MB

english, 2011

10

SPIE Proceedings [SPIE Photomask and NGL Mask Technology XVI - Yokohama, Japan (Wednesday 8 April 2009)] Photomask and Next-Generation Lithography Mask Technology XVI - Investigation of EUV mask defectivity via full-field printing and inspection on wafer

Jonckheere, Rik, Hosono, Kunihiro, Van Den Heuvel, Dieter, Iwamoto, Fumio, Stepanenko, Nickolay, Myers, Alan, Lamantia, Matt, Goethals, Anne-Marie, Hendrickx, Eric, Ronse, Kurt

Year:

2009

Language:

english

File:

PDF, 4.84 MB

english, 2009

11

SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 28 March 2005)] Targets and Backgrounds XI: Characterization and Representation - Mapping sensible and latent heat fluxes in arid areas using optical imagery

Hendrickx, Jan M. H., Hong, Sung-ho, Watkins, Wendell R., Clement, Dieter, Reynolds, William R.

Year:

2005

Language:

english

File:

PDF, 285 KB

english, 2005

12

Screening strategy targeting the presence of food enzyme-producing fungi in food enzyme preparations

Deckers, Marie, Vanneste, Kevin, Winand, Raf, Hendrickx, Marijke, Becker, Pierre, Keersmaecker, Sigrid C.J.D.E., Deforce, Dieter, Marie-Alice, Fraiture, Hc Roosens, Nancy

Journal:

Year:

2020

File:

PDF, 2.50 MB

2020

13

SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 28 March 2005)] Targets and Backgrounds XI: Characterization and Representation - Regional mapping of root zone soil moisture using optical satellite imagery

Fleming, K., Hendrickx, Jan M. H., Hong, Sung-ho, Watkins, Wendell R., Clement, Dieter, Reynolds, William R.

Year:

2005

Language:

english

File:

PDF, 723 KB

english, 2005

14

SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 28 March 2005)] Targets and Backgrounds XI: Characterization and Representation - Effect of scaling transfer between evapotranspiration maps derived from LandSat 7 and MODIS images

Hong, Sung-ho, Hendrickx, Jan M. H., Borchers, Brian, Watkins, Wendell R., Clement, Dieter, Reynolds, William R.

Year:

2005

Language:

english

File:

PDF, 1.09 MB

english, 2005

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